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Multi-Bandwidth Frequency Selective Surfaces for Near Infrared Filtering: Design and OptimizationFrequency selective surfaces are widely used in the microwave and millimeter wave regions of the spectrum for filtering signals. They are used in telecommunication systems for multi-frequency operation or in instrument detectors for spectroscopy. The frequency selective surface operation depends on a periodic array of elements resonating at prescribed wavelengths producing a filter response. The size of the elements is on the order of half the electrical wavelength, and the array period is typically less than a wavelength for efficient operation. When operating in the optical region, diffraction gratings are used for filtering. In this regime the period of the grating may be several wavelengths producing multiple orders of light in reflection or transmission. In regions between these bands (specifically in the infrared band) frequency selective filters consisting of patterned metal layers fabricated using electron beam lithography are beginning to be developed. The operation is completely analogous to surfaces made in the microwave and millimeter wave region except for the choice of materials used and the fabrication process. In addition, the lithography process allows an arbitrary distribution of patterns corresponding to resonances at various wavelengths to be produced. The design of sub-millimeter filters follows the design methods used in the microwave region. Exacting modal matching, integral equation or finite element methods can be used for design. A major difference though is the introduction of material parameters and thicknesses that may not be important in longer wavelength designs. This paper describes the design of multi- bandwidth filters operating in the 1-5 micrometer wavelength range. This work follows on a previous design. In this paper extensions based on further optimization and an examination of the specific shape of the element in the periodic cell will be reported. Results from the design, manufacture and test of linear wedge filters built using microlithographic techniques and used in spectral imaging applications will be presented.
Document ID
20000053101
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
Authors
Cwik, Tom
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Fernandez, Salvador
(Ciencia, Inc. East Hartford, CT United States)
Ksendzov, A.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
LaBaw, Clayton C.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Maker, Paul D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Muller, Richard E.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 1998
Subject Category
Communications And Radar
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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