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3D MEMS in Standard Processes: Fabrication, Quality Assurance, and Novel Measurement MicrostructuresThree-dimensional MEMS microsystems that are commercially fabricated require minimal post-processing and are easily integrated with CMOS signal processing electronics. Measurements to evaluate the fabrication process (such as cross-sectional imaging and device performance characterization) provide much needed feedback in terms of reliability and quality assurance. MEMS technology is bringing a new class of microscale measurements to fruition. The relatively small size of MEMS microsystems offers the potential for higher fidelity recordings compared to macrosize counterparts, as illustrated in the measurement of muscle cell forces.
Document ID
20000056607
Acquisition Source
Headquarters
Document Type
Other
Authors
Lin, Gisela
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Lawton, Russell A.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2000
Subject Category
Electronics And Electrical Engineering
Funding Number(s)
CONTRACT_GRANT: 1059-GI-3
CONTRACT_GRANT: NIH-HL-47065
PROJECT: RTOP 323-79-2L
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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