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Space Radiation Effects and Hardness Assurance for Linear Integrated CircuitsNew effects that complicate the application of linear devices in space are discussed, including enhanced damage at low dose rate and proton damage, which cause permanent degradation. Transients produced by protons and heavy ions are also discussed.
Document ID
20000056938
Acquisition Source
Headquarters
Document Type
Other
Authors
Johnston, A. H. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2000
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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