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COSIM: A Finite-Difference Computer Model to Predict Ternary Concentration Profiles Associated with Oxidation and Interdiffusion of Overlay-Coated SubstratesA finite-difference computer program (COSIM) has been written which models the one-dimensional, diffusional transport associated with high-temperature oxidation and interdiffusion of overlay-coated substrates. The program predicts concentration profiles for up to three elements in the coating and substrate after various oxidation exposures. Surface recession due to solute loss is also predicted. Ternary cross terms and concentration-dependent diffusion coefficients are taken into account. The program also incorporates a previously-developed oxide growth and spalling model to simulate either isothermal or cyclic oxidation exposures. In addition to predicting concentration profiles after various oxidation exposures, the program can also be used to predict coating fife based on a concentration dependent failure criterion (e.g., surface solute content drops to two percent). The computer code, written in an extension of FORTRAN 77, employs numerous subroutines to make the program flexible and easily modifiable to other coating oxidation problems.
Document ID
20000120367
Acquisition Source
Glenn Research Center
Document Type
Technical Memorandum (TM)
Authors
Nesbitt, James A.
(NASA Glenn Research Center Cleveland, OH United States)
Date Acquired
September 7, 2013
Publication Date
August 1, 2000
Subject Category
Metals And Metallic Materials
Report/Patent Number
NAS 1.15:209271
NASA/TM-2000-209271
E-11721
Report Number: NAS 1.15:209271
Report Number: NASA/TM-2000-209271
Report Number: E-11721
Funding Number(s)
PROJECT: RTOP 714-04-20
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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