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Use of Computed Tomography for Characterizing Materials Grown Terrestrially and in MicrogravityThe purpose behind this work is to provide NASA Principal Investigators (PIs) rapid information, nondestructively, about their samples. This information will be in the form of density values throughout the samples, especially within slices 1 mm high. With correct interpretation and good calibration, these values will enable the PI to obtain macro chemical compositional analysis for his/her samples. Alternatively, the technique will provide information about the porosity level and its distribution within the sample. Experience gained with a NASA Microgravity Research Division-sponsored Advanced Technology Development (ATD) project on this topic has brought the technique to a level of maturity at which it has become a viable characterization tool for many of the Materials Science Pls, but with equipment that could never be supported within their own facilities. The existing computed tomography (CT) facility at NASA's Kennedy Space Center (KSC) is ideally situated to furnish information rapidly and conveniently to PIs, particularly immediately before and after flight missions.
Document ID
20010057247
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Gillies, Donald C.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Engel, H. P.
(Wyle Labs., Inc. United States)
Date Acquired
August 20, 2013
Publication Date
March 1, 2001
Publication Information
Publication: Microgravity Materials Science Conference 2000
Volume: 1
Subject Category
Chemistry And Materials (General)
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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