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AMSD Alignment Sensitivity AnalysisA review of the optical layout for AMSD testing is presented. This includes all optical components from the point source to the mirror under test. The independent sources of error and uncertainty are discussed, and the approach to determining and reducing the measurement uncertainties is presented.
Document ID
20010078911
Acquisition Source
Marshall Space Flight Center
Document Type
Abstract
Authors
Reardon, Patrick (Alabama Univ. Huntsville, AL United States)
Stahl, Philip (NASA Marshall Space Flight Center Huntsville, AL United States)
Burdine, Robert
Date Acquired
August 20, 2013
Publication Date
January 1, 2001
Subject Category
Optics
Meeting Information
Meeting: MSFC Technology Days
Location: Huntsville, AL
Country: United States
Start Date: May 9, 2001
End Date: May 10, 2001
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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