Acquisition Source
Ames Research Center
Authors
Sharma, S. P. (NASA Ames Research Center Moffett Field, CA United States) Rao, M. V. V. S. (Eloret Corp. United States) Meyyappan, Meyya (NASA Ames Research Center Moffett Field, CA United States) Date Acquired
August 20, 2013
Publication Date
January 23, 2000
Meeting Information
Meeting: 2000 International Conference on Characterization and Metrology for ULSI Technology
Location: Gaithersburg, MD
Country: United States
Start Date: June 26, 2000
End Date: June 29, 2000
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.