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Advances in FeRAM TechnologiesCommercial ferroelectric random access memories (FeRAMs) are emerging into the marketplace. Reliability levels have been measured to be comparable to or better than those of other reprogrammable nonvolatile semiconductor technologies. Both SBT and PZT ferroelectric materials have been used in these memories for the memory storage elements. By combining ferroelectric memory technology with radiation hardened CMOS technology. nonvolatile semiconductor memories for space applications can be attained. These memories have high endurance. fast write times and low power performance. While significant efforts are underway at major semiconductor manufacturers worldwide to develop ferroelectric memory businesses, funding limitations must be overcome to allow the development of radiation hardened ferroelectric memories for space applications.
Document ID
20020043717
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
Gary F Derbenwick
(Celis Semiconductor Corporation Colorado Springs, CO United States)
David A Kamp
(Celis Semiconductor Corporation Colorado Springs, CO United States)
Stephen C Philpy
(Celis Semiconductor Corporation Colorado Springs, CO United States)
Alan F Isaacson
(Celis Semiconductor Corporation Colorado Springs, CO United States)
Date Acquired
August 20, 2013
Publication Date
November 1, 2000
Publication Information
Publication: Non-Volatile Memory Technology Symposium 2000: Proceedings
Publisher: Jet Propulsion Laboratory
Subject Category
Electronics and Electrical Engineering
Report/Patent Number
JPL-Publ-00-15
Meeting Information
Meeting: Non-Volatile Memory Technology Symposium 2000
Location: Arlington, VA
Country: US
Start Date: November 15, 2000
End Date: November 16, 2000
Sponsors: Jet Propulsion Laboratory
Distribution Limits
Public
Copyright
Public Use Permitted.
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