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Friction Stir Weld Inspection Through Conductivity Imaging Using Shaped Field MWM(Registered Trademark) - ArraysFriction Stir Welds (FSW) of Al 2195-T8 and Al 2219-T8, provided by Lockheed Martin Michoud Operations, were inspected for lack-of-penetration (LOP) defects using a custom designed MWM-Array, a multi-element eddy-current sensor. MWM (registered trademark) electrical conductivity mapping demonstrated high sensitivity to LOP as small as 0.75 mm (0.03 in.), as confirmed by metallographic data that characterized the extent of LOP defects. High sensitivity and high spatial resolution was achieved via a 37-element custom designed MWM-Array allowing LOP detection using the normalized longitudinal component of the MWM measured conductivity. This permitted both LOP detection and correlation of MWM conductivity features with the LOP defect size, as changes in conductivity were apparently associated with metallurgical features within the near-surface layer of the LOP defect zone. MWM conductivity mapping reveals information similar to macro-etching as the MWM-Array is sensitive to small changes in conductivity due to changes in microstructure associated with material thermal processing, in this case welding. The electrical conductivity measured on the root side of FSWs varies across the weld due to microstructural differences introduced by the FSW process, as well as those caused by planar flaws. Weld metal, i.e., dynamically recrystallized zone (DXZ), thermomechanically affected zone (TMZ), heat-affected zone (HAZ), and parent metal (PM) are all evident in the conductivity maps. While prior efforts had met with limited success for NDE (Nondestructive Evaluation) of dissimilar alloy, Al2219 to Al2195 FSW, the new custom designed multi-element MWM-Array achieved detection of all LOP defects even in dissimilar metal welds.
Document ID
20020066666
Acquisition Source
Marshall Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Goldfine, Neil
(JENTEK Sensors, Inc. Waltham, MA United States)
Grundy, David
(JENTEK Sensors, Inc. Waltham, MA United States)
Zilberstein, Vladimir
(JENTEK Sensors, Inc. Waltham, MA United States)
Kinchen, David G.
(Lockheed Martin Michoud Space Systems New Orleans, LA United States)
McCool, Alex
Date Acquired
September 7, 2013
Publication Date
January 1, 2002
Subject Category
Mechanical Engineering
Meeting Information
Meeting: AEROMAT
Location: Orlando, FL
Country: United States
Start Date: June 10, 2002
End Date: June 13, 2002
Funding Number(s)
CONTRACT_GRANT: NAS8-00016
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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