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Paint AnalysisLewis Research Center (LEW) has assisted The Cleveland Museum of Art (CMA) in analyzing the museum's paintings. Because of the many layers of paint that are often involved, this is a complex process. The cross-section of a paint chip must be scanned with a microscope to determine whether a paint layer is original or a restoration. The paint samples, however, are rarely flat enough for high magnification viewing and are frequently scratched. LEW devised an automated method that produces intact, flat, polished paint cross-sections. A sophisticated microprocessor-controlled grinding and polishing machine was manually employed in preparation of exotic samples for aerospace research was a readily adaptable technique. It produced perfectly flat samples with clearly defined layers. The process has been used successfully on a number of paintings, and LEW and CMA are considering additional applications.
Document ID
20020080085
Acquisition Source
Legacy CDMS
Document Type
Other
Date Acquired
September 7, 2013
Publication Date
January 1, 1994
Publication Information
Publication: Spinoff 1994
ISBN: 0-16-045368-2
Subject Category
Nonmetallic Materials
Report/Patent Number
ISBN: 0-16-045368-2
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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