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Novel On-wafer Radiation Pattern Measurement Technique for MEMS Actuator Based Reconfigurable Patch AntennasThe paper presents a novel on-wafer, antenna far field pattern measurement technique for microelectromechanical systems (MEMS) based reconfigurable patch antennas. The measurement technique significantly reduces the time and the cost associated with the characterization of printed antennas, fabricated on a semiconductor wafer or dielectric substrate. To measure the radiation patterns, the RF probe station is modified to accommodate an open-ended rectangular waveguide as the rotating linearly polarized sampling antenna. The open-ended waveguide is attached through a coaxial rotary joint to a Plexiglas(Trademark) arm and is driven along an arc by a stepper motor. Thus, the spinning open-ended waveguide can sample the relative field intensity of the patch as a function of the angle from bore sight. The experimental results include the measured linearly polarized and circularly polarized radiation patterns for MEMS-based frequency reconfigurable rectangular and polarization reconfigurable nearly square patch antennas, respectively.
Document ID
20020090930
Acquisition Source
Glenn Research Center
Document Type
Technical Memorandum (TM)
Authors
Simons, Rainee N.
(NASA Glenn Research Center Cleveland, OH United States)
Date Acquired
September 7, 2013
Publication Date
October 1, 2002
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NAS 1:15:211816
E-13508
NASA/TM-2002-211816
Meeting Information
Meeting: 24th Annual Antenna Measurement Techniques Association Meeting and Symposium
Location: Cleveland, OH
Country: United States
Start Date: November 3, 2002
End Date: November 8, 2002
Funding Number(s)
PROJECT: RTOP 755-08-0B
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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