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Current Single Event Effects and Radiation Damage Results for Candidate Spacecraft ElectronicsWe present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, total ionizing dose and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.
Document ID
20030025415
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
OBryan, Martha V. (Raytheon Information Technology and Scientific Services Lanham, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Reed, Robert A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Ray L. (Orbital Sciences Corp. McLean, VA, United States)
Howard, James W., Jr. (Jackson and Tull Chartered Engineers Washington, DC, United States)
Kniffin, Scott D. (Orbital Sciences Corp. McLean, VA, United States)
Poivey, Christian (SGT, Inc. Greenbelt , MD, United States)
Buchner, Stephen P. (QSS Group, Inc. Lanham, MD, United States)
Bings, John P. (Naval Sea Systems Command Crane, IN, United States)
Titus, Jeff L. (Naval Sea Systems Command Crane, IN, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2002
Subject Category
Spacecraft Instrumentation And Astrionics
Meeting Information
Meeting: 2002 IEEE Nuclear and Space Radiation Effects Conference
Location: Phoenix, AZ
Country: United States
Start Date: July 15, 2002
End Date: July 19, 2002
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: DTRA-IACRO-01-4050/0001278
Distribution Limits
Public
Copyright
Public Use Permitted.

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