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Emission Line Spectra in the Soft X-ray Region 20 - 75 AngstromsAs part of a project to complete a comprehensive catalogue of astrophysically relevant emission lines in support of new-generation X-ray observatories using the Lawrence Livermore electron beam ion traps EBIT-I and EDIT-II, emission lines of argon and sulfur in the soft X-ray and extreme ultraviolet region were studied. Observations of Ar IX through Ar XVI and S VII through S XIV between 20 and 75 Angstrom are presented to illustrate our work.
Document ID
20030058875
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Lepson, J. K. (California Univ. Berkeley, CA, United States)
Beiersdorfer, P. (Lawrence Livermore National Lab. Livermore, CA, United States)
Chen, H. (Lawrence Livermore National Lab. Livermore, CA, United States)
Behar, E. (Columbia Univ. New York, NY, United States)
Kahn, S. M. (Columbia Univ. New York, NY, United States)
Date Acquired
August 21, 2013
Publication Date
November 1, 2002
Publication Information
Publication: Proceedings of the NASA Laboratory Astrophysics Workshop
Subject Category
Astronomy
Funding Number(s)
CONTRACT_GRANT: W-7405-Eng-48
CONTRACT_GRANT: NASA Order W-19878
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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