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Measurement of Absolute Excitation Cross Sections in Highly-Charged Ions Using Electron Energy Loss and Merged BeamsThere is increasing emphasis during this decade on understanding energy balance and phenomena observed in high electron temperature plasmas. The UV spectral return from FUSE, the X-ray spectral return from the HETG on Chandra and the LETGS 011 XMM-Newton are just beginning. Line emissions are almost entirely from highly-charged ions (HCIs) of C, N, 0, Ne, Mg, S, Si, Ca, and Fe. The Constellation-X mission will provide X-ray spectroscopy up to photon energies of 0.12 nm (10 keV) where primary line emitters will be HCIs. A variety of atomic parameters are required to model the stellar and solar plasma. These include cross sections for excitation, ionization, charge-exchange, X-ray emission, direct and indirect recombination, lifetimes and branching ratios, and dependences on l, m mixing by external E and B fields. In almost all cases the atomic quantities are calculated, and few comparisons to experiment have been carried out. Collision strengths and Einstein A-values are required to convert the observed spectral intensities to electron temperatures and densities in the stellar plasma. The JPL electron energy-loss and merged beam approach has been used to measure absolute collision strengths in a number of ions, with critical comparison made to the best available theories.
Document ID
20030058905
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Chutjian, A.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Smith, Steven J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Lozano, J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 21, 2013
Publication Date
November 1, 2002
Publication Information
Publication: Proceedings of the NASA Laboratory Astrophysics Workshop
Subject Category
Atomic And Molecular Physics
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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