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DLC Film Growth on the Surface of Monocrystalline Si and α -Al2O3 With The Usage of Ion SourceThe technology of diamond-like carbon (DLC) film deposition, that allows to vary the composition and structure of the film giving an opportunity to modify the properties of the obtained samples, has been developed. In the present work the special gas-mixer was utilized, with the help of which the gas mixtures of C7H8 or C6H12, Ar and N2 were supplied between the anode and cathode of the ion source. By varying the electrical parameters of ion source and concentration of gas mixture and by shaping the plasma geometry, it is possible to modify the average kinetic energy of ions that have reached the substrate. This feature has permitted to grow DLC films on the surfaces of monocrystalline Si (c-Si), Al2O3 and other substrates over a 100 cm2 area with non-uniformity of characteristics less than 5%. The density p of the obtained films has been increased up to 2.5 g/cm3, and the microhardness HV - up to 3100 kgf/mm2. The DLC films are stable to chemically hostile environment, to radiation impacts, as well to thermal influences up to 400 °C. By altering the film deposition conditions it is possible to vary the electrical, optical and mechanical properties of DLC films in a wide range.
Document ID
20030068559
Acquisition Source
Glenn Research Center
Document Type
Conference Paper
Authors
Zh Panosyan
(State Engineering University of Armenia Yerevan, Armenia)
S Voskanyan
(State Engineering University of Armenia Yerevan, Armenia)
Y Yengibaryan
(State Engineering University of Armenia Yerevan, Armenia)
A Stepanyan
(State Engineering University of Armenia Yerevan, Armenia)
Date Acquired
August 21, 2013
Publication Date
August 1, 2003
Publication Information
Publication: Proceedings of the Seventh Applied Diamond Conference/Third Frontier Carbon Technology Joint Conference
Publisher: National Aeronautics and Space Administration
Subject Category
Nonmetallic Materials
Report/Patent Number
NASA/CP-2003-212319
Meeting Information
Meeting: 3rd Frontier Carbon Technology (FCT) Joint Conference
Location: Tsukuba
Country: JP
Start Date: August 18, 2003
End Date: August 21, 2003
Sponsors: Nippon Institute of Technology, National Institute of Advanced Industrial Science and Technology, Glenn Research Center
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Keywords
density
microhardness
uniformity
technology
DLC film
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