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Hole Mobility in Boron-Doped Homoepitaxial CVD Diamond Thin FilmsThe electric conductivity and Hall effect of boron-doped homoepitaxial CVD diamond thin films have been measured in the temperature range from 150K to 900 K. The temperature dependence of Hall mobility is analyzed by using an iterative technique assuming the scattering by ionized impurities, acoustic deformation potential and nonpolar optical phonons. The acoustic deformation potential constant EI, the coupling constant of nonpolar optical phonons Dnpo and the donor concentration ND are used as fitting parameters. We take into account the band nonparabolicity through the hyperbolic band model. The density of state mass md, the conduction mass mc) and the nonparabolicity parameter alpha are estimated from a LAPW band calculation. The temperature dependence of hole concentration is also numerically analyzed on the basis of the electric neutrality and the hyperbolic band model with fitting parameters of the acceptor concentration NA, the donor concentration ND, and the acceptor ionization energy EA. For all the samples, best fits between experimental and theoretical values are obtained when EI approx. 16.0 eV, Dnpo approx. 1.2x1012 eV/m and EA approx. 0.365 eV. Some indications of the impurity conduction were seen in the low temperature range.
Document ID
20030068626
Acquisition Source
Glenn Research Center
Document Type
Conference Paper
Authors
Kunio Tsukioka
(Tamagawa University Tokyo, Japan)
Hisashi Ogawa
(Tamagawa University Tokyo, Japan)
Hideyo Okushi
(National Institute of Advanced Industrial Science and Technology Tsukuba, Japan)
Date Acquired
August 21, 2013
Publication Date
August 1, 2003
Publication Information
Publication: Proceedings of the Seventh Applied Diamond Conference/Third Frontier Carbon Technology Joint Conference
Publisher: National Aeronautics and Space Administration
Subject Category
Electronics and Electrical Engineering
Report/Patent Number
NASA/CP-2003-212319
Meeting Information
Meeting: 7th Applied Diamond Conference (ADC)
Location: Tsukuba
Country: JP
Start Date: August 18, 2003
End Date: August 21, 2003
Sponsors: Nippon Institute of Technology, National Institute of Advanced Industrial Science and Technology, Glenn Research Center
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
CVD diamond thin films
Hall mobility
Scattering mechanisms
impurity conduction
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