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Anti-Wear Characteristics of Carbon Nitride Thin FilmsThe carbon nitride has been proposed theoretically with a possible structure of β -C3N4, which have replaced Si of β -Si3N4 with C, by Liu and Cohen in 1989. It was announced that β-C3N4 had a higher bulk-modulus value than that of diamond. The research in forming C-N compounds has been actively done. Recently, it has been reported that carbon nitride film has showed a unique property, such as a high elastic recovery compared with DLC film, even if a structure of this film was amorphous. In this study, carbon nitride films have been deposited by means of the magnetically enhanced plasma ion-plating equipment. The following two methods of the deposition were investigated. One is the reactive ion-plating which is a reactive evaporation between carbon vapor and nitrogen plasma. The second is a method of an ionized evaporation caused by mixed gas plasma using hydrocarbon and nitrogen gases. Wear performance and deformation energy evaluation of the films were examined by the micro-wear and nano-indentation tests using AFM device having a peculiar transformer head added to the measuring units. Moreover, crystal structure and chemical composition of the film have been analyzed using FT-IR and XPS, respectively. The film formed with the ionized evaporation using C2H2-Ar-N2 gas plasma showed that the hardness becomes harder than that of the film formed with the reactive ion-plating, due to the confirmation of C-N bonding structure from the result of FT-IR and XPS. When the film is formed under CH4-N2 gas plasma, it has been observed that no micro-wear of the film was occurred, resulting in showing good wear resistance. This is understood that the film shows large elastic recovery from the result of the deformation energy evaluation.
Document ID
20030068654
Acquisition Source
Glenn Research Center
Document Type
Conference Paper
Authors
Shuichi Watanabe
(Nippon Institute of Technology Shiraoka, Japan)
Shojiro Miyake
(Nippon Institute of Technology Shiraoka, Japan)
Mieko Sutoh
(Nippon Institute of Technology Shiraoka, Japan)
Masao Murakawa
(Nippon Institute of Technology Shiraoka, Japan)
Date Acquired
August 21, 2013
Publication Date
August 1, 2003
Publication Information
Publication: Proceedings of the Seventh Applied Diamond Conference/Third Frontier Carbon Technology Joint Conference
Publisher: National Aeronautics and Space Administration
Subject Category
Solid-State Physics
Report/Patent Number
NASA/CP-2003-212319
Meeting Information
Meeting: 3rd Frontier Carbon Technology (FCT) Joint Conference
Location: Tsukuba
Country: JP
Start Date: August 18, 2003
End Date: August 21, 2003
Sponsors: Nippon Institute of Technology, National Institute of Advanced Industrial Science and Technology, Glenn Research Center
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
Deformation energy evaluation
Micro-wear
Ionized evaporation
Ion-plating
Carbon nitride film
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