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Multi-Sensor Durability Characterization of Thin Diamond-Like FilmsA number of durability tests have been performed on the precision micro-tribometer UMT, using various upper tools like hard ceramic balls, pins, blades and diamond stylus, in such testing modes as uni-directional or reciprocating linear and rotational motions. Multiple test parameters were monitored simultaneously, including servo-controlled vertical load, lateral friction force, high-frequency contact acoustic emission, contact or surface electrical resistance, digital video of the testing zone. The multi-sensing technology allowed for repeatable and comprehensive characterization of the durability of both thick (microns) and thin (nanometers) diamond-like films.
Document ID
20030068672
Acquisition Source
Glenn Research Center
Document Type
Conference Paper
Authors
N V Gitis (Center for Tribology, Inc. Campbell, CA, United States)
J Xiao (Center for Tribology, Inc. Campbell, CA, United States)
M Vinogradov (Center for Tribology, Inc. Campbell, CA, United States)
Date Acquired
August 21, 2013
Publication Date
August 1, 2003
Publication Information
Publication: Proceedings of the Seventh Applied Diamond Conference/Third Frontier Carbon Technology Joint Conference
Publisher: National Aeronautics and Space Administration
Subject Category
Solid-State Physics
Report/Patent Number
NASA/CP-2003-212319
Meeting Information
Meeting: 7th Applied Diamond Conference (ADC)
Location: Tsukuba
Country: JP
Start Date: August 18, 2003
End Date: August 21, 2003
Sponsors: Nippon Institute of Technology, National Institute of Advanced Industrial Science and Technology, Glenn Research Center
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
durability tests
films
multiple sensors
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IDRelationTitle20030068525Collected WorksProceedings of the Seventh Applied Diamond Conference/Third Frontier Carbon Technology Joint Conference (ADC/FCT 2003)
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