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Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASAWe present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include optoelectronics, digital, analog, linear bipolar devices, hybrid devices, Analog-to-Digital Converters (ADCs), and Digital-to-Analog Converters (DACs), among others.
Document ID
20030093747
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Cochran, Donna J.
(QSS Group, Inc. Lanham, MD, United States)
Kniffin, Scott D.
(Orbital Sciences Corp. McLean, VA, United States)
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
OBryan, Martha V.
(Raytheon Information Technology and Scientific Services Lanham, MD, United States)
Reed, Robert A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Ray L.
(Orbital Sciences Corp. McLean, VA, United States)
Howard, James W., Jr.
(Jackson and Tull Chartered Engineers Washington, DC, United States)
Poivey, Christian
(SGT, Inc. Greenbelt , MD, United States)
Buchner, Stephen P.
(QSS Group, Inc. Lanham, MD, United States)
Marshall, Cheryl J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2003
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Nuclear and Space Radiation Effects Conference 2003
Location: Monterey, CA
Country: United States
Start Date: July 21, 2003
End Date: July 25, 2003
Funding Number(s)
CONTRACT_GRANT: DTRA-IACRO-02-40391
Distribution Limits
Public
Copyright
Public Use Permitted.
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