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Single Event Effects Results for Candidate Spacecraft Electronics for NASAWe present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.
Document ID
20030102156
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
O'Bryan, Martha
(Raytheon Information Technology and Scientific Services Greenbelt, MD, United States)
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kniffin, Scott D.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Howard, James W., Jr.
(Jackson and Tull, Inc. Greenbelt, DC, United States)
Poivey, Christian
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Ray L.
(Orbital Sciences Corp. Greenbelt, MD, United States)
Buchner, Stephen P.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Xapsos, Michael
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Reed, Robert A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Sanders, Anthony B.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2003
Subject Category
Spacecraft Design, Testing And Performance
Meeting Information
Meeting: Nuclear and Space Radiation Effects Conference
Location: Monterey, CA
Country: United States
Start Date: July 21, 2003
End Date: July 25, 2003
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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