The Data Acquisition and Controls Systems (DACS) of the E-Complex at the John C. Stennis Space Center, MS: A General Overview

The John C. Stennis Space Center (SSC) provides test operations services to a variety of customers including NASA, DoD, commercial enterprises, and others for the development of current next-generation rocket propulsion systems. Many of these test operations services are provided in the E-Complex series of test facilities. The E-Complex is composed of three active test stands (E1, E2, & E3), each with two or more test positions. Each test position is comprised of unique sets of data acquisition and controls hardware and software that record both facility and test article data and safely operate the test facility. The E-Complex data acquisition system (DAS) is actually composed of two separate systems, one for static data and the other for dynamic. The static DAS, otherwise known as the Low-Speed DAS (LSDAS), samples 16 bit data at 250 samples-per-second (SPS), although an aggregate sample rate of 200,000 SPS is possible. The dynamic data acquisition system, otherwise known as the high-speed DAS (HSDAS), samples 16 bit data at 100K SPS with a 45 KHz bandwidth.