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Characteristics of Single-Event Upsets in a Fabric Switch (ADS151)Abstract-Two types of single event effects - bit errors and single event functional interrupts - were observed during heavy-ion testing of the AD8151 crosspoint switch. Bit errors occurred in bursts with the average number of bits in a burst being dependent on both the ion LET and on the data rate. A pulsed laser was used to identify the locations on the chip where the bit errors and single event functional interrupts occurred. Bit errors originated in the switches, drivers, and output buffers. Single event functional interrupts occurred when the laser was focused on the second rank latch containing the data specifying the state of each switch in the 33x17 matrix.
Document ID
20040031739
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Buchner, Stephen (QSS Group, Inc. Seabrook, MD, United States)
Carts, Martin A. (Raytheon Co.)
McMorrow, Dale (Naval Research Lab. Washington, DC, United States)
Kim, Hak (Jackson and Tull, Inc.)
Marshall, Paul W. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2003
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: European Conference on Radiation and its Effects on Components and Systems (RADECS)
Location: Duin
Country: Netherlands
Start Date: September 15, 2003
End Date: September 19, 2003
Distribution Limits
Public
Copyright
Public Use Permitted.

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