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Low Temperature SQUID for NDE ApplicationsWe have developed a low temperature SuperConducting Quantum Interference Device - SQUID measurement system for detection of defects deep under the surface of aluminum structures using eddy current techniques. The system uses a two dimensional planar inducer with two different excitation frequencies to induce a current in the sample. We have developed a data analysis software program that enabled us to distinguish between round defects (holes), straight defects (slots) and slots close to holes simulating cracks starting from rivets in aluminum structures. We were able to detect defects that are 8mm below the surface. We have also measured the change in phase of the detected signal as a function of depth of the defect. This relationship can be used to determine the depth of hidden flaws. Using this analysis software with the high temperature SQUID system at NASA Langley we were able to detect slots close to holes in layered aluminum sample.
Document ID
20040045173
Acquisition Source
Headquarters
Document Type
Contractor or Grantee Report
Authors
Wincheski, Buzz
(NASA Langley Research Center Hampton, VA, United States)
Selim, Raouf
(Christopher Newport Univ. Newport News, VA, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2003
Subject Category
Instrumentation And Photography
Funding Number(s)
CONTRACT_GRANT: NAG1-02055
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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