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A Chip and Pixel Qualification Methodology on Imaging SensorsThis paper presents a qualification methodology on imaging sensors. In addition to overall chip reliability characterization based on sensor s overall figure of merit, such as Dark Rate, Linearity, Dark Current Non-Uniformity, Fixed Pattern Noise and Photon Response Non-Uniformity, a simulation technique is proposed and used to project pixel reliability. The projected pixel reliability is directly related to imaging quality and provides additional sensor reliability information and performance control.
Document ID
20040073471
Acquisition Source
Langley Research Center
Document Type
Contractor Report (CR)
Authors
Chen, Yuan (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Guertin, Steven M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Petkov, Mihail (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Nguyen, Duc N. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Novak, Frank (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2004
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA/CR-2003-212167
Funding Number(s)
OTHER: 23-762-45-G6
CONTRACT_GRANT: NCC1-02043
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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