NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Advanced Technology Development: Solid-Liquid Interface Characterization HardwareCharacterizing the solid-liquid interface during directional solidification is key to understanding and improving material properties. The goal of this Advanced Technology Development (ATD) has been to develop hardware, which will enable real-time characterization of practical materials, such as aluminum (Al) alloys, to unprecedented levels. Required measurements include furnace and sample temperature gradients, undercooling at the growing interface, interface shape, or morphology, and furnace translation and sample growth rates (related). These and other parameters are correlated with each other and time. A major challenge was to design and develop all of the necessary hardware to measure the characteristics, nearly simultaneously, in a smaller integral furnace compatible with existing X-ray Transmission Microscopes, XTMs. Most of the desired goals have been accomplished through three generations of Seebeck furnace brassboards, several varieties of film thermocouple arrays, heaters, thermal modeling of the furnaces, and data acquisition and control (DAC) software. Presentations and publications have resulted from these activities, and proposals to use this hardware for further materials studies have been submitted as sequels to this last year of the ATD.
Document ID
20040073510
Document Type
Other
Date Acquired
August 21, 2013
Publication Date
December 1, 2003
Publication Information
Publication: Biological and Physical Space Research Laboratory 2002 Science Review
Subject Category
Computer Operations and Hardware
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

IDRelationTitle20040073490Analytic PrimaryBiological and Physical Space Research Laboratory 2002 Science Review