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4H-SiC UV Photo Detector with Large Area and Very High Specific DetectivityPt/4H-SiC Schottky photodiodes have been fabricated with the device areas up to 1 sq cm. The I-V characteristics and photo-response spectra have been measured and analyzed. For a 5 mm x 5 mm area device leakage current of 1 x 10(exp 15)A at zero bias and 1.2 x 10(exp 14)A at -IV have been established. The quantum efficiency is over 30% from 240nm to 320nm. The specific detectivity, D(sup *), has been calculated from the directly measured leakage current and quantum efficiency data and are shown to be higher than 10(exp 15) cmHz(sup 1/2)/W from 210nm to 350nm with a peak D(sup *) of 3.6 x 10(exp 15)cmH(sup 1/2)/W at 300nm.
Document ID
20040082193
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Yan, Feng
(Raytheon Co. Greenbelt, MD, United States)
Shahid, Aslam
(Raytheon Co. Greenbelt, MD, United States)
Franz, David
(Raytheon Co. Greenbelt, MD, United States)
Xin, Xiaobin
(Rutgers Univ. Piscataway, NJ, United States)
Zhao, Jian H.
(Rutgers Univ. Piscataway, NJ, United States)
Zhao, Yuegang
(Keithley Instruments, Inc. Cleveland, OH, United States)
Winer, Maurice
(United Silicon Carbide, Inc. New Brunswick, NJ, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2004
Subject Category
Instrumentation And Photography
Funding Number(s)
CONTRACT_GRANT: NE-EK000-2-00302
Distribution Limits
Public
Copyright
Public Use Permitted.
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