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Single Axis Piezoceramic GimbalThis paper describes the fabrication, testing, and analysis of a single axis piezoceramic gimbal. The fabrication process consists of pre-stressing a piezoceramic wafer using a high-temperature thermoplastic polyimide and a metal foil. The differential thermal expansion between the ceramic and metal induces a curvature. The pre-stressed, curved piezoceramic is mounted on a support mechanism and a mirror is attached to the piezoceramic. A plot of gimbal angle versus applied voltage to the piezoceramic is presented. A finite element analysis of the piezoceramic gimbal is described. The predicted gimbal angle versus applied voltage is compared to experimental results.
Document ID
20040086802
Acquisition Source
Langley Research Center
Document Type
Other
Authors
Horner, Garnett
(NASA Langley Research Center Hampton, VA, United States)
Taleghani, Barmac
(Army Research Lab. Hampton, VA, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2001
Subject Category
Avionics And Aircraft Instrumentation
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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