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Self-Nulling Eddy Current Probe for Surface and Subsurface Flaw DetectionAn eddy current probe which provides a null-signal in the presence of unflawed material without the need for any balancing circuitry has been developed at NASA Langley Research Center. Such a unique capability of the probe reduces set-up time, eliminates tester configuration errors, and decreases instrumentation requirements. The probe is highly sensitive to surface breaking fatigue cracks, and shows excellent resolution for the measurement of material thickness, including material loss due to corrosion damage. The presence of flaws in the material under test causes an increase in the extremely stable and reproducible output voltage of the probe. The design of the probe and some examples illustrating its flaw detection capabilities are presented.
Document ID
20040111997
Acquisition Source
Langley Research Center
Document Type
Other
Authors
Wincheski, B.
(Analytical Services and Materials, Inc. Hampton, VA, United States)
Fulton, J. P.
(Analytical Services and Materials, Inc. Hampton, VA, United States)
Nath, S.
(Analytical Services and Materials, Inc. Hampton, VA, United States)
Namkung, M.
(NASA Langley Research Center Hampton, VA, United States)
Simpson, J. W.
(Lockheed Engineering and Sciences Co. Hampton, VA, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 1994
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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