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Quantifying Wrinkle Features of Thin Membrane StructuresFor future micro-systems utilizing membrane based structures, quantified predictions of wrinkling behavior in terms of amplitude, angle and wavelength are needed to optimize the efficiency and integrity of such structures, as well as their associated control systems. For numerical analyses performed in the past, limitations on the accuracy of membrane distortion simulations have often been related to the assumptions made. This work demonstrates that critical assumptions include: effects of gravity, supposed initial or boundary conditions, and the type of element used to model the membrane. In this work, a 0.2 m x 02 m membrane is treated as a structural material with non-negligible bending stiffness. Finite element modeling is used to simulate wrinkling behavior due to a constant applied in-plane shear load. Membrane thickness, gravity effects, and initial imperfections with respect to flatness were varied in numerous nonlinear analysis cases. Significant findings include notable variations in wrinkle modes for thickness in the range of 50 microns to 1000 microns, which also depend on the presence of an applied gravity field. However, it is revealed that relationships between overall strain energy density and thickness for cases with differing initial conditions are independent of assumed initial conditions. In addition, analysis results indicate that the relationship between wrinkle amplitude scale (W/t) and structural scale (L/t) is independent of the nonlinear relationship between thickness and stiffness.
Document ID
20040171451
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Jacobson, Mindy B.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Iwasa, Takashi
(Institute of Space and Astronautical Science Sagamihara, Japan)
Naton, M. C.
(Institute of Space and Astronautical Science Sagamihara, Japan)
Date Acquired
September 7, 2013
Publication Date
January 1, 2004
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: CANEUS 2004
Location: Monterey, CA
Country: United States
Start Date: November 1, 2004
End Date: November 5, 2004
Distribution Limits
Public
Copyright
Public Use Permitted.
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