Optical and Thermal Analyses of High-Power Laser Diode Arrays

An important need, especially for space-borne applications, is the early identification and rejection of laser diode arrays which may fail prematurely. The search for reliable failure predictors is ongoing and has led to the development of two techniques, infrared imagery and monitoring the Temporally-resolved and Spectrally-Resolved (TSR) optical output from which temperature of the device can be measured. This is in addition to power monitoring on long term burn stations. A direct measurement of the temperature of the active region is an important parameter as the lifetime of Laser Diode Arrays (LDA) decreases exponentially with increasing temperature. We measure the temperature from time-resolving the spectral emission in an analogous method to Voss et al. In this paper we briefly discuss the measurement setup and present temperature data derived from thermal images and TSR data for two differently designed high-power 808 nanometer LDA packages of similar specification operated in an electrical and thermal environment that mimic the expected operational conditions.