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[Development of Nanotechnology for X-Ray Astronomy Instrumentation]This Research Grant provides support for development of nanotechnology for x-ray astronomy instrumentation. MIT has made significant progress in several development areas. In the last year we have made considerable progress in demonstrating the high-fidelity patterning and replication of x-ray reflection gratings. We developed a process for fabricating blazed gratings in silicon with extremely smooth and sharp sawtooth profiles, and developed a nanoimprint process for replication. We also developed sophisticated new fixturing for holding thin optics during metrology without causing distortion. We developed a new image processing algorithm for our Shack-Hartmann tool that uses Zernike polynomials. This has resulted in much more accurate and repeatable measurements on thin optics.
Document ID
20040191314
Acquisition Source
Headquarters
Document Type
Contractor or Grantee Report
Authors
Schattenburg, Mark L.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2004
Subject Category
Astronomy
Report/Patent Number
MIT-OSP-6894530
Report Number: MIT-OSP-6894530
Funding Number(s)
CONTRACT_GRANT: NAG5-5405
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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