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Thermal Insulation Testing Method and ApparatusA test apparatus and method of its use for evaluating various performance aspects of a test specimen is disclosed. A chamber within a housing contains a cold mass tank with a contact surface in contact with a first surface of a test specimen. The first surface of the test specimen is spaced from the second surface of the test specimen by a thickness. The second surface of the test specimen is maintained at a a constant temperature by a liquid disposed within the cold mass tank. A boil-off flow rate of the gas is monitored and provided to a processor along with the temperature of the first and second surfaces of the test specimen. The processor calculates thermal insulation values of the test specimen including comparative values for heat flux and apparent thermal conductivity k-value). The test specimen may be placed in any vacuum pressure level ranging from about 0.01 millitorr to 1,000,000 millitorr with different residual gases as desired. The test specimen may be placed under a mechanical load with the cold mass tank and another factors may be imposed upon the test specimen so as to simulate the actual use conditions.
Document ID
20050050956
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Fesmire, James E.
(NASA Kennedy Space Center Cocoa Beach, FL, United States)
Augustynowicz, Stanislaw D.
(NASA Kennedy Space Center Cocoa Beach, FL, United States)
Date Acquired
September 7, 2013
Publication Date
November 30, 2004
Subject Category
Mechanical Engineering
Report/Patent Number
US-Patent-Appl-SN-318665
US-Patent-6,824,306
Report Number: US-Patent-Appl-SN-318665
Report Number: US-Patent-6,824,306
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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