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Introduction to the Sub-pixel Spatial Resolution Interferometry ProcessIn this paper we describe a method called "Sub-Pixel Spatial Resolution Interferometry" used to increase the spatial resolution of interferometric measurements of precision optical surfaces. In this process, multiple interferometric measurements are made as the optic under test (or the CCD array)in shifted at sub-pixel increments. The measurements are then combined to construct a measurement with higher spatial resolution than the original measurements. The process will be described and initial results obtained using this process with a commercially available Fizeau interferometer will be presented.
Document ID
20050182028
Acquisition Source
Marshall Space Flight Center
Document Type
Abstract
Authors
Mooney, James T.
(Alabama Univ. Huntsville, AL, United States)
Stahl, H. Phil
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 23, 2013
Publication Date
January 1, 2005
Subject Category
Optics
Meeting Information
Meeting: Opti Fab Conference
Location: Rochester, NY
Country: United States
Start Date: May 2, 2005
End Date: May 5, 2005
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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