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Design of Amphoteric Refraction Models Using WAVICA and RAYICAThe phenomenon of refraction of light is due to refractive index mismatches in two different media. However, to achieve this effect, a finite reflection loss is inevitable. A recent finding presented a unique type of interface, ferroelastic materials, that enables refraction without any reflection for either an electron or a light beam. This property is called total refraction. The same type of interface that yields total refraction can also yield amphoteric refraction, where the index of refraction can be either positive or negative depending on the incident angle. This interface could potentially be used to steer light without reflections which could have major applications in high power optics. My goal this summer is to first familiarize myself with the Mathematica software, especially the Wavica and Rayica packages. I will then model the amphoteric refraction by either modifying the Wavica and Rayica packages or using the built-in functions in these packages.
Document ID
20050186835
Document Type
Conference Paper
Authors
Su, Richard (California Univ. Berkeley, CA, United States)
Date Acquired
August 23, 2013
Publication Date
January 1, 2004
Publication Information
Publication: Research Symposium I
Subject Category
Electronics and Electrical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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