Characterization of an 8-cm Diameter Ion Source System

Results of tests characterizing an 8-cm diameter ion source are presented. The tests were conducted in three separate vacuum test facilities at the University of Alabama-Huntsville, Colorado State University, and L3 Communications' ETI division. Standard ion optics tests describing electron backstreaming and total-voltage-limited impingement current behavior as a function of beam current were used as guidelines for selecting operating conditions where more detailed ion beam measurements were performed. The ion beam was profiled using an in-vacuum actuating probe system to determine the total ion current density and the ion charge state distribution variation across the face of the ion source. Both current density and ExB probes were utilized. The ion current density data were used to obtain integrated beam current, beam flatness parameters, and general beam profile shapes. The ExB probe data were used to determine the ratio of doubly to singly charged ion current. The ion beam profile tests were performed at over six different operating points that spanned the expected operating range of the DAWN thrusters being developed at L3. The characterization tests described herein reveal that the 8-cm ion source is suitable for use in (a) validating plasma diagnostic equipment, (b) xenon ion sputtering and etching studies of spacecraft materials, (c) plasma physics research, and (d) the study of ion thruster optics at varying conditions.