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Advanced Electronics Technologies: Challenges for Radiation Effects Testing, Modeling, and MitigationEmerging Electronics Technologies include: 1) Changes in the commercial semiconductor world; 2) Radiation Effects Sources (A sample test constraint); and 3) Challenges to Radiation Testing and Modeling: a) IC Attributes-Radiation Effects Implication b) Fault Isolation c) Scaled Geometry d) Speed e) Modeling Shortfall f) Knowledge Status
Document ID
20060002696
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
LaBel, Kenneth A. (NASA Headquarters Washington, DC United States)
Cohn, Lewis M. (Defense Threat Reduction Agency United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2005
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Space Environment Effects Working Group
Location: El Segundo, CA
Country: United States
Start Date: November 1, 2005
End Date: November 3, 2005
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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