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SIM astrometric demonstration at the 150 picometer level using the MAM testbedThis paper describes the MAM optical setup, the alignment process, the current data and how the performance relates to SIM.
Document ID
20060028626
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/6532
Authors
Goullioud, R.
Hines, B. E.
Bell, C. E.
Shen, T. J.
Bloemhof, E. E.
Date Acquired
August 23, 2013
Publication Date
March 15, 2003
Distribution Limits
Public
Copyright
Other
Keywords
interferometry SIM picometers metrology astrometry

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