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Qualification and reliability testing of a microchip laser system for space applicationsThis paper discusses the process being used and the results of the selection and qualification of a low cost prepackaged diode laser with a custom packaged microchip laser crystal.
Document ID
20060028892
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/7223
Authors
Wright, M. W.
Franzen, D.
Hemmati, H.
Sandor, M.
Date Acquired
August 23, 2013
Publication Date
July 7, 2003
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
laser qualification reliability

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