NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Single-event effects in advanced CMOS devicesThis paper discusses single-event upset in memories and microprocessors, along with the mechanisms that cause SEU effects.
Document ID
20060029971
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/10026
Authors
Johnston, A. H.
Date Acquired
August 23, 2013
Publication Date
September 19, 2002
Subject Category
Space Radiation
Distribution Limits
Public
Copyright
Other
Keywords
single-event upset CMOS space radiation

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available