NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
External merology truss technology demonstration (KITE)To achieve micro-arcsecond astrometry, SIM's external metrology system must track the relative changes of three baseline vectors with a precision of tens of picometers over a one-hour time scale.
Document ID
20060030189
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/10469
Authors
Nemati, B.
Date Acquired
August 23, 2013
Publication Date
August 1, 2002
Subject Category
Instrumentation And Photography
Distribution Limits
Public
Copyright
Other
Keywords
metrology interferometry corner cube truss picometer heterodyne

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available