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Utilization of advanced microelectronics in space applications
Document ID
20060030369
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/10684
Authors
Kayali, S.
Date Acquired
August 23, 2013
Publication Date
November 4, 2002
Distribution Limits
Public
Copyright
Other
Keywords
microelectronics reliability qualification radiation effects

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