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Affecting stress in BGA by microwave radiation application
Document ID
20060030479
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/11088
Authors
Burdaa, N. K.
Drexler, E.
Date Acquired
August 23, 2013
Publication Date
December 3, 2002
Distribution Limits
Public
Copyright
Other
Keywords
BGA electronics reliability stress annealing microwaves

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