NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Characterization of Picometer repeatability displacement metrology gaugesA facility to test the linearity and drift of heterodyne laser metrology gauges for measuring distances of 1 to 7 meters with 10 picometer repeatability is described.
Document ID
20060031723
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/13060
Authors
Halverson, P. G.
Azevedo, L. S.
Diaz, R. T.
Spero, R. E.
Date Acquired
August 23, 2013
Publication Date
September 20, 2001
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
metrology space interferometry mission interferometry

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available