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A Neat Methodology for Microprocessor Upset Testing
Document ID
20060032662
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/14323
Authors
Swift, G.
Date Acquired
August 23, 2013
Publication Date
April 11, 2000
Distribution Limits
Public
Copyright
Other
Keywords
single event effects single event upset microprocessor testing

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