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Latchup Test Consideration for Analog-to-Digital Converter
Document ID
20060032663
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/14324
Authors
Johnston, A.
Miyahira, T.
Date Acquired
August 23, 2013
Publication Date
April 13, 2000
Distribution Limits
Public
Copyright
Other
Keywords
single-event effects latchup

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