NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Elemental Surface Analysis at Ambient PressureThe development of a portable surface elemental analysis tool based on the excitation of characteristics x-rays at ambient pressure with an electron beam is described.
Document ID
20060033116
Acquisition Source
Jet Propulsion Laboratory
Document Type
Reprint (Version printed in journal)
External Source(s)
hdl:2014/15705
Authors
Feldman, J.
Wilcox, J.
George, T.
Barsic, D.
Scherer, A.
Date Acquired
August 23, 2013
Publication Date
January 1, 2000
Publication Information
Publication: Applied Physics Letters
Subject Category
Physics (General)
Distribution Limits
Public
Copyright
Other
Keywords
atmospheric electron x-ray spectrometer XRF EDX EDAX surface analysis microprobe

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available