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Ballistic-electron-emission microscopy of device materials and structures
Document ID
20060033254
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/15901
Authors
Bell, L. D.
Date Acquired
August 23, 2013
Publication Date
August 9, 2000
Distribution Limits
Public
Copyright
Other
Keywords
semiconductors electron spectroscopy
scanning tunneling microscopy ballistic electron emission microscopy

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