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Can interface roughness be useful in devices
Document ID
20060033263
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Ting, D. Z.
Bandara, S.
Gunapala, S.
Liu, J.
Mumolo, J.
Rafol, S.
Gu, M.
Date Acquired
August 23, 2013
Publication Date
August 14, 2000
Distribution Limits
Public
Copyright
Other
Keywords
interface roughness infrared detector

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