NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Low Temperature Characterization of FD-SOI Transistors for Extreme Environments in Deep Space Exploration Missions
Document ID
20060034315
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Patel, J.
Yuan, J.
Date Acquired
August 23, 2013
Publication Date
March 18, 2000
Distribution Limits
Public
Copyright
Other
Keywords
Fully Depleted SOI Low temperature Extreme Environments

Available Downloads

There are no available downloads for this record.
No Preview Available