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Review and Document Reliability Issues With Hybrid MicrocircuitsReliability issues and lessons learned are described for hybrid microcircuits (including multi-chip modules) used for space applications.
Document ID
20060036986
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/29260
Authors
Report, R. E. Gauldin Interim Status
Cuddihy, E. F.
Date Acquired
August 23, 2013
Publication Date
April 1, 1995
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
reliability hybrid microcircuits electronic parts reliability

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